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X-Ray Free-Electron Lasers : Beam Diagnostics, Beamline Instrumentation, and Applications II

Hau-Riege, Stefan(Edited by)Moeller, Stefan(Edited by)Yabashi, Makina(Edited by)
Part of the Proceedings of SPIE series
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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

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£61.95
Product Details
SPIE Press
1628412372 / 9781628412376
Paperback / softback
30/01/2015
United States
277 pages
152 x 229 mm
Professional & Vocational Learn More