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Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials (Softcover reprint of hardcover 2nd ed. 2010)

Part of the Springer series in advanced microelectronics series
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This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices.

This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

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Product Details
3642264786 / 9783642264788
Paperback / softback
06/11/2012
Germany
258 pages, 33 Illustrations, color; 56 Illustrations, black and white; X, 258 p. 89 illus., 33 illus
155 x 235 mm, 415 grams
Professional & Vocational Learn More