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1997 IEEE International Conference on Microelectronics Test Structures Proceedings : Proceedings ... / Sponsored by the IEEE Electron Devices Society.

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Product Details
I.E.E.E.Press
0780332431 / 9780780332430
Paperback / softback
01/01/1997
United States
225 pages
222 x 286 mm, 771 grams
General (US: Trade)/Professional & Vocational/Postgraduate, Research & Scholarly/Undergraduate Learn More