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ISTFA : Book and CD-ROM Set

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This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis.

The CD-ROM presents the complete content of the book in fully searchable Adobe Acrobat PDF format.

Contents: Fault Isolation of the Electrical Fail over Sample Presentation; Imaging and Material Analysis; Failure Analysis Process Flows on Individual Components; System-Level Performance; Manufacturing yield Enhancements; Packaging Issues and Solutions; Hot Topics such as Optical Probing and Tester-Driven Failure Analysis.

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Product Details
ASM International
0871707888 / 9780871707888
Mixed media product
01/10/2003
United States
700 pages
Professional & Vocational/Postgraduate, Research & Scholarly/Technical / vocational (manuals etc) Learn More