Image for International Conference on Microelectronic Test Structures

International Conference on Microelectronic Test Structures

See all formats and editions

This international conference covers advances in recent developments and future directions on all microelectronic test structures and their applications for characterisation of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.

Read More
Available
£77.50
Add Line Customisation
Usually dispatched within 4 weeks
Add to List
Product Details
I.E.E.E.Press
0780308573 / 9780780308572
Paperback / softback
01/01/1993
United States
412 pages
Professional & Vocational/Postgraduate, Research & Scholarly/Undergraduate Learn More