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International Conference on Microelectronic Test Structures (2000 ed.)

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These conference proceedings cover such topics as: CD meteorology; device characterization; yield and interconnects; poster session; matching; reliability; parameter extraction; and process characterization.

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£122.50
Product Details
I.E.E.E.Press
0780362756 / 9780780362758
Paperback / softback
01/04/2000
United States
290 pages
216 x 279 mm
Professional & Vocational/Postgraduate, Research & Scholarly Learn More