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International Integrated Reliability Workshop

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The international Intergrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. A new language has been developed and the conference used terms such as S.W.E.A.T.; V and J Ramp, BIR.

WLQ, and CHARM.

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£86.50
Product Details
0780327055 / 9780780327054
Paperback / softback
621.381
01/01/1996
United States
200 pages
Professional & Vocational Learn More