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Symposium on VLSI Technology

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These conference prodeedings cover such topics as: copper interconnects; novel devices; high-K dielectrics; process technology; embedded DRAM; gate electrode engineering; DRAM cells; gate oxide scaling and reliability; DRAM capacitors; and high performance RF.

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£145.14
Product Details
I.E.E.E.Press
0780363086 / 9780780363083
CD-ROM
621.395
01/07/2000
United States
Professional & Vocational/Postgraduate, Research & Scholarly Learn More