Microprobe Characterization of Optoelectronic Materials

Each chapter in this book is written by a group of experts in one particular type of microprobe technique.

They emphasize the ability of that technique to provide information about small structures (quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic techniques for device degradation.

Different types of probes are considered (electrons, photon and tips) and different microscopies (optical, electron microscopy and tunnelling).

It is a reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.