Image for RF measurements of die and packages

RF measurements of die and packages

Part of the Microwave Library series
See all formats and editions

This text is dedicated to the issues surrounding RFIC (radio-frequency integrated circuit) testing.

It explains how to perform high-accuracy RF measurements of die and packages in the RF test lab.

It defines the essential elements in an RF system, explains where errors can be found in such a system and shows how to mathematically remove them with calibration.

This book should be of interest to: RFIC designers and high-frequency digital IC designers, IC test engineers and IC manufacturing test engineers.

Read More
Special order line: only available to educational & business accounts. Sign In
£101.00
Product Details
Artech House Publishers
158053273X / 9781580532730
Hardback
31/05/2002
United States
English
272 p. : ill.
23 cm
research & professional /technical & vocational Learn More