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Robust Design of DRAM Core Circuits : Yield Estimation and Analysis by a Statistical Design Approach

Part of the Ausgewahlte Probleme Der Elektronik Und Mikromechatronik S. series
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£30.53
Product Details
Shaker Verlag GmbH, Germany
3832298452 / 9783832298456
Paperback / softback
28/02/2011
Germany
139 pages, 95 illustrations
148 x 210 mm
Professional & Vocational/Postgraduate, Research & Scholarly Learn More