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IEEE Recommended Practice for Latchup Test Methods for Cmos and Bicmos Integrated-Circuit Process Characterization

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£42.95
Product Details
IEEE Publications,U.S.
1559371528 / 9781559371520
Paperback / softback
01/01/1997
United States
36 pages
260 x 330 mm, 159 grams
Professional & Vocational/Postgraduate, Research & Scholarly/Undergraduate Learn More