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Test Conference : International Conference Proceedings (1996 ed.)

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The IEEE Test Conference is one of the largest premier technical conferences on the testing and total quality of integrated electronic circuits and the systems that are based on them.

This text covers the 1996 conference.

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Product Details
I.E.E.E.Press
0780342097 / 9780780342095
Paperback / softback
621.395
01/01/1997
United States
1000 pages
216 x 279 mm
Professional & Vocational/Technical / vocational (manuals etc) Learn More